Atomistic studies of helium trapping and diffusion at Ni-graphene
interfaces
H Huang and XX Ge and X Yu and YX Jiang and Q Peng, EUROPEAN PHYSICAL
JOURNAL PLUS, 140, 497 (2025).
DOI: 10.1140/epjp/s13360-025-06447-1
The use of metal-nanocarbon interfaces to prevent the bubble-to-void
transition has emerged as a novel approach for developing materials
resistant to helium (He) embrittlement. However, many critical
mechanisms governing He dynamics near these interfaces remain
inadequately understood. Here we employed the Ni-graphene interface
(NGI) as a model system to investigate He trapping and diffusion through
atomistic simulations (300-1,200 K). Key findings demonstrate rapid He
trapping at NGIs, with anisotropic in-plane diffusion
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exhibiting a tenfold higher diffusivity (prefactor: 6.251 x 10-2 nm2 &
sdot;ps-1) and lower activation energy (0.057 eV) than pure Ni. Above
600 K, interfacial capture dominates, minimizing bulk residence. Unlike
hydrogen, which forms stable C-H bonds, He migrates freely along NGIs
without chemical interaction, promoting release. NGIs could suppress 3D
bubble growth by redirecting He into planar pathways, aligning with
observed bubble size reduction. The work contrasts He dynamics at NGIs
versus grain boundaries, highlighting the superior capacity of metal-
nanocarbon interfaces for He venting. These insights provide a
mechanistic basis for designing helium-resistant composites, advancing
strategies to mitigate embrittlement through controlled helium
transport.
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