Geometric Variability-Aware Thermal Characteristics Modeling of Nanoscale Silicon Gate-All-around Nanowire Transistor
XY Feng and K Luo and GH Zhan and LJ Xu and QZ Xu and ZH Wu, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 221 (2024).
DOI: 10.1002/pssa.202400435
Thermal management becomes increasingly important in silicon gate-all-
around (GAA) field-effect transistor (FETs) for 3 nm technology node and
beyond. The channel thermal conductivity significantly differs from bulk
silicon. Precise determination of thermal conductivity is crucial for
device evaluation and optimization. This study investigates the thermal
conductivity of silicon nanowires, examining the complex interplay
between size and channel orientation. The conventional nonequilibrium
molecular dynamics (NEMD) method is used with the standard Stillinger-
Weber potential at the atomic scale. The results indicate that the
thermal conductivity of silicon nanowires along the 100 direction
increases monotonically with both length (L) and cross-sectional side
length (D). Conversely, the 110 direction exhibits nonmonotonic
variation in thermal conductivity with D, due to increased acoustic-
optic phonon scattering. For GAA FET devices with a silicon nanowire
channel of L = 20 nm and D = 5 nm, the NEMD calculations yield thermal
conductivities of 10.8 W m
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