A survey of the crystallography-dependency of twist grain boundary mobility in Al based on atomistic simulations

L Yang and CM Lai and SY Li, MATERIALS LETTERS, 263, 127293 (2020).

DOI: 10.1016/j.matlet.2019.127293

The correlations between the mobility and crystallographic parameters of twist grain boundaries (GBs) are investigated based on a mobility dataset created by molecular dynamics simulations using a modified synthetic driving force method. Statistically, low-angle twist GBs are not less or more mobile than highangle ones, but twist GBs with axes near < 111 > or boundary plane close to 111 have low mobilities. These tendencies are significantly different from those revealed for symmetrical tilt GBs. The mobility overall does not exhibit any visible correlation with the coincidence index or energy of a GB. (C) 2020 Elsevier B.V. All rights reserved.

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