Identification of montmorillonite particle edge orientations by atomic- force microscopy

SV Kraevsky and C Tournassat and M Vayer and F Warmont and S Grangeon and BFN Wakou and AG Kalinichev, APPLIED CLAY SCIENCE, 186, 105442 (2020).

DOI: 10.1016/j.clay.2020.105442

Statistical information on the edge surface area and edge crystallographic orientation of clay nanoparticle surfaces is essential for proper accounting of the protonation-deprotonation reactions as a part of mechanistic surface complexation models. A combination of atomic-force microscopy (AFM) measurements and molecular dynamics computer simulations made it possible to quantify the relative contributions of the most frequently occurring montmorillonite edge surfaces to the total edge surface area. Edge surfaces normal to the 110 and 010 crystallographic directions are found to be the most abundant (similar to 60% and similar to 20%, respectively), in agreement with previous estimations.

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